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Microplasma Noise as a Diagnostic Tool for PN Junctions of High-Voltage Rectifier Diodes
Raška, Michal ; Chobola, Zdeněk (referee) ; Hájek, Karel (referee) ; Koktavý, Pavel (advisor)
The doctoral thesis deals with diagnostics of local defects in PN junctions and brings new information about microplasma noise behaviour and its usage for the temperature changes detection inside PN junctions. Defects in PN junctions are the source of microplasma noise. There were deviations observed in microplasma noise from the common known rectangle shape pulses during the measurements. These deviations were correlated with the temperature change directly in the defect area and in the defect area surroundings. Generation and recombination coefficients are commonly thought to be constant. However, these coefficients were observed to be not stable with time and this effect is explained in this work. The doctoral thesis then focuses on the PN junction parameters determination in the case when it is not possible to define unambiguously whether it is abrupt or linearly graded PN junction. The most significant parameters which are to be determined are barrier capacity, diffusion voltage and depleted area width in dependence on the voltage. The correlation between local avalanche discharge in PN junction and negative differential resistance appearance on VA characteristics of reverse-biased diode was qualitatively verified. The last important point in the work is computer modelling of temperature behaviour in the defect area and its surroundings during local avalanche breakdown. Thus the method of real diodes heating area parameters determination was introduced.
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Analysis of Fluctuation Processes of Solar Cells
Macků, Robert ; Chobola, Zdeněk (referee) ; Franc,, Jan (referee) ; Koktavý, Pavel (advisor)
The thesis deals issue of the silicon solar cells non-destructive testing. The manufacturing technology of solar cells currently features a very high level of perfection. Its further development appears to be limited by amongst other issues imperfect diagnostic methods. The objective of presented research consists in non-destructive studies of processes that influence specimen life and reliability. To this end, I will employ mainly noise based analytical methods in connection with observation of defect optical activities, capacitance measurement etc. These methods are closely related to some specimen bulk imperfections, crystal-lattice defect induced traps, local-stress-subjected regions and, finally, breakdowns, which might bring about specimen destruction. Based on a detailed study and understanding of transport processes, regions in which noise is generated can be identified and appropriate technological measures can be proposed and adopted. Presented research focuses, first of all, on the real solar cell structures, which are inhomogeneous in their nature and are difficult to diagnose. The significant part of this study is attend to the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about reduction of lifetime or destruction of the pn junction. The micro-sized regions have been studied separately by electrical and optical methods and defect properties have been put forward. Nevertheless, no less significant part of the thesis is devoted to the fluctuation modeling of the bulk imperfections in the semi-analytical form.
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Anyalyze of photovoltaic cell by noise diagnostic
Husák, Marek ; Sládek, Petr (referee) ; Vaněk, Jiří (advisor)
The master’s thesis deals with the noise diagnostic in the solar cells. Describes the main kinds of noises. The samples were quality and reliability screened using noise reliability indicators. The samples were surveyed by measuring the I-V characteristics, the noise spectral density as a function of forward voltage and frequency. It was calculated the noise spectral density as a function of forward current.
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Analysis of Fluctuation Processes of Solar Cells
Macků, Robert ; Chobola, Zdeněk (referee) ; Franc,, Jan (referee) ; Koktavý, Pavel (advisor)
The thesis deals issue of the silicon solar cells non-destructive testing. The manufacturing technology of solar cells currently features a very high level of perfection. Its further development appears to be limited by amongst other issues imperfect diagnostic methods. The objective of presented research consists in non-destructive studies of processes that influence specimen life and reliability. To this end, I will employ mainly noise based analytical methods in connection with observation of defect optical activities, capacitance measurement etc. These methods are closely related to some specimen bulk imperfections, crystal-lattice defect induced traps, local-stress-subjected regions and, finally, breakdowns, which might bring about specimen destruction. Based on a detailed study and understanding of transport processes, regions in which noise is generated can be identified and appropriate technological measures can be proposed and adopted. Presented research focuses, first of all, on the real solar cell structures, which are inhomogeneous in their nature and are difficult to diagnose. The significant part of this study is attend to the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about reduction of lifetime or destruction of the pn junction. The micro-sized regions have been studied separately by electrical and optical methods and defect properties have been put forward. Nevertheless, no less significant part of the thesis is devoted to the fluctuation modeling of the bulk imperfections in the semi-analytical form.
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Microplasma Noise as a Diagnostic Tool for PN Junctions of High-Voltage Rectifier Diodes
Raška, Michal ; Chobola, Zdeněk (referee) ; Hájek, Karel (referee) ; Koktavý, Pavel (advisor)
The doctoral thesis deals with diagnostics of local defects in PN junctions and brings new information about microplasma noise behaviour and its usage for the temperature changes detection inside PN junctions. Defects in PN junctions are the source of microplasma noise. There were deviations observed in microplasma noise from the common known rectangle shape pulses during the measurements. These deviations were correlated with the temperature change directly in the defect area and in the defect area surroundings. Generation and recombination coefficients are commonly thought to be constant. However, these coefficients were observed to be not stable with time and this effect is explained in this work. The doctoral thesis then focuses on the PN junction parameters determination in the case when it is not possible to define unambiguously whether it is abrupt or linearly graded PN junction. The most significant parameters which are to be determined are barrier capacity, diffusion voltage and depleted area width in dependence on the voltage. The correlation between local avalanche discharge in PN junction and negative differential resistance appearance on VA characteristics of reverse-biased diode was qualitatively verified. The last important point in the work is computer modelling of temperature behaviour in the defect area and its surroundings during local avalanche breakdown. Thus the method of real diodes heating area parameters determination was introduced.
|
|
|
Anyalyze of photovoltaic cell by noise diagnostic
Husák, Marek ; Sládek, Petr (referee) ; Vaněk, Jiří (advisor)
The master’s thesis deals with the noise diagnostic in the solar cells. Describes the main kinds of noises. The samples were quality and reliability screened using noise reliability indicators. The samples were surveyed by measuring the I-V characteristics, the noise spectral density as a function of forward voltage and frequency. It was calculated the noise spectral density as a function of forward current.
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